UHV Scanning Tunneling Microscope

A Ultra High Vacuum (UHV) apparatus for advanced surface characterization (Omicron Multiprobe S) is equipped with an Atomic Force Microscope/Scanning Tunneling Microscope (AFM/STM) working with sample temperature variable in the 25-1500 K range (Omicron VT SPM). The microscope allows atomic resolution both in the AFM and in the STM mode. It will be able to work in a gas partial pressure. It is also equipped with a e-beam evaporator capable of working during the measurements in the STM mode. The apparatus is equipped with a preparation chamber with ion gun and LEED/AUGER for surface preparation. The analysis chamber is specially designed to host other characterization techniques (monochromatic XPS).

This apparatus is connected to a PLD deposition apparatus for in situ characterization in UHV conditions. The sample can be transferred in vacuum using magnetically coupled transfer devices.

<< back


UHV STM / AFM


In situ sample transfer system

Micro and Nanostructured Materials Lab, Department of Energy Politecnico di Milano Via Ponzio 34/3 I-20133 Milan, Italy